New high-capability solid-state electron microscope detector enables novel studies of materials

At Cornell University, the Sol M. Gruner (SMG) detector group has developed and demonstrated a new type of imaging electron detector that records an image frame in 1/1000 of a second, and can detect from 1 to 1,000,000 electrons per pixel. This is 1000 times the intensity range, and 100 times the speed of conventional electron microscope image sensors.