07-05-2016 21:47 via indianexpress.com

Atomic Force Microscopes get a technology boost - The Indian Express

The Indian Express
Atomic Force Microscopes get a technology boost
The Indian Express
Developing a method to replace the needle in Atomic Force Microscopes, used to observe nano-sized particles, without changing the spring in the structure. Published:May 8, 2016, 1:17. technology. Science in 140 characters: What scientists are tweeting ...
Read more »