Atomic Force Microscopes get a technology boost

R Sri Muthu Mrinalini & G R Jayanth | IISc, Bangalore
As more uses are found for nano-sized particles, there is an increasing need to ‘see’ and ‘feel’ them in order to understand their properties and behaviour better. For decades, electron microscopes have been used to observe atomic-sized particles. These days, however, Atomic Force Microscopes (AFM) are gaining popularity as they have certain advantages over the electron microscope.
Unlike electron microscopes